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Communication Dans Un Congrès Année : 2019

Low-frequency Noise Characterization of Si Nanonet Field Effect Transistors

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hal-02400620 , version 1 (09-12-2019)

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  • HAL Id : hal-02400620 , version 1

Citer

Thibauld Cazimajou, Christoforos Theodorou, Thuy Thi Thu Nguyen, Maxime Legallais, Mireille Mouis, et al.. Low-frequency Noise Characterization of Si Nanonet Field Effect Transistors. 25th International Conference on Noise and Fluctuations (ICNF), Jun 2019, Neuchâtel, Switzerland. Actes pp. 180-183. ⟨hal-02400620⟩
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