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Thomas Jalabert, Manojit Pusty, Andrés Jenaro Lopez Garcia, Alessandro Cresti, Mireille Mouis, et al.. ZnO nanowires based piezoelectric transducers: the role of size and semiconducting properties. SPIE Optics + Optoelectronics, Apr 2023, Prague, Czech Republic. pp.1258406-1, ⟨10.1117/12.2665500⟩. ⟨hal-04160671⟩

Owen Gauthier, Sébastien Haendler, Ronan Beucher, Patrick Scheer, Quentin Rafhay, et al.. Static and LFN/RTN Local and Global Variability Analysis Using an Addressable Array Test Structure. 2023 35th International Conference on Microelectronic Test Structure (ICMTS), Mar 2023, Tokyo, Japan. pp.1-6, ⟨10.1109/ICMTS55420.2023.10094087⟩. ⟨hal-04305404⟩

Donghyun Kim, Sylvain Barraud, Gérard Ghibaudo, Christoforos Theodorou, Jae Woo Lee. Drain Current Variability in 2-levels Stacked Nanowire Gate All Around P-type Field Effect Transistors. 2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM), Mar 2023, Seoul, South Korea. pp.1-3, ⟨10.1109/EDTM55494.2023.10103067⟩. ⟨hal-04305370⟩

Romeo Kom Kammeugne, Charles Leroux, Christoforos Theodorou, Laura Vauche, Matthew Charles, et al.. On-wafer drain current aariability in GaN MIS-HEMT on 200-mm silicon substrates. Journal of Electronics and Electrical Engineering, 2023, 2 (1), pp.12-23. ⟨10.37256/jeee.2120232132⟩. ⟨hal-04305208⟩