Detection of the first charged states in ultrasmall Si single-hole transistor using dual-channel radio frequency reflectometry - Université Grenoble Alpes
Communication Dans Un Congrès Année : 2014
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hal-02018063 , version 1 (13-02-2019)

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  • HAL Id : hal-02018063 , version 1

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Alexei Orlov, Patrick Fay, Gregory Snider, Xavier Jehl, Sylvain Barraud, et al.. Detection of the first charged states in ultrasmall Si single-hole transistor using dual-channel radio frequency reflectometry. 2014 72nd Annual Device Research Conference (DRC), Jun 2014, Santa Barbara, France. pp.83-84. ⟨hal-02018063⟩
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