In situ and ex situ monitoring and metrology for the development of a selective deposition process - Université Grenoble Alpes
Communication Dans Un Congrès Année : 2018

In situ and ex situ monitoring and metrology for the development of a selective deposition process

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hal-01959042 , version 1 (18-12-2018)

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  • HAL Id : hal-01959042 , version 1

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C. Vallee, R. Gassilloud, B. Pelissier, R. Vallat, V. Pesce, et al.. In situ and ex situ monitoring and metrology for the development of a selective deposition process. 18th International Conference on Atomic layer Deposition (ALD2018), Jul 2018, Incheon, South Korea. ⟨hal-01959042⟩
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