Direct detection of a transport-blocking trap in a nanoscaled silicon single-electron transistor by radio-frequency reflectometry - Université Grenoble Alpes
Article Dans Une Revue Applied Physics Letters Année : 2014

Direct detection of a transport-blocking trap in a nanoscaled silicon single-electron transistor by radio-frequency reflectometry

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hal-02009699 , version 1 (06-02-2019)

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  • HAL Id : hal-02009699 , version 1

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B. Villis, A. Orlov, S. Barraud, M. Vinet, M. Sanquer, et al.. Direct detection of a transport-blocking trap in a nanoscaled silicon single-electron transistor by radio-frequency reflectometry. Applied Physics Letters, 2014, 104 (23), pp.233503. ⟨hal-02009699⟩
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