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Article dans une revue

Suppression of self-organized surface nanopatterning on GaSb/InAs multilayers induced by low energy oxygen ion bombardment by using simultaneously sample rotation and oxygen flooding

Abstract : Time of flight secondary ion mass spectrometry (ToF-SIMS) is a well-adapted analytical method for the chemical characterization of concentration profiles in layered or multilayered materials. However, under ion beam bombardment, initially smooth material surface becomes morphologically unstable. This leads to abnormal secondary ion yields and depth profile distortions. In this contribution, we explore the surface topography and roughening evolution induced by O-2(+) ion bombardment on GaSb/InAs multilayers. We demonstrate the formation of nanodots and ripples patterning according to the ion beam energy. Since the latter are undesirable for ToF-SIMS analysis, we managed to totally stop their growth by using simultaneously sample rotation and oxygen flooding. This unprecedented coupling between these two latter mechanisms leads to a significant enhancement in depth profiles resolution.
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https://hal.univ-grenoble-alpes.fr/hal-01947878
Contributeur : Marielle Clot <>
Soumis le : vendredi 7 décembre 2018 - 11:43:41
Dernière modification le : samedi 1 août 2020 - 03:03:28

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Georges Beainy, Tiphaine Cerba, Franck Bassani, Mickaël Martin, Thierry Baron, et al.. Suppression of self-organized surface nanopatterning on GaSb/InAs multilayers induced by low energy oxygen ion bombardment by using simultaneously sample rotation and oxygen flooding. Applied Surface Science, Elsevier, 2018, 441, pp.218-222. ⟨10.1016/j.apsusc.2018.02.009⟩. ⟨hal-01947878⟩

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