Use of optical spacers to enhance infrared Mueller ellipsometry sensitivity: application to the characterization of organic thin films

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http://hal.univ-grenoble-alpes.fr/hal-01882073
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Submitted on : Wednesday, September 26, 2018 - 3:25:06 PM
Last modification on : Wednesday, March 27, 2019 - 4:20:04 PM

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Gérald Ndong, Angel Lizana, Enric Garcia-Caurel, Valerie Paret, Géraldine Melizzi, et al.. Use of optical spacers to enhance infrared Mueller ellipsometry sensitivity: application to the characterization of organic thin films. Applied optics, Optical Society of America, 2016, 55 (12), pp.436 - 439. ⟨10.1364/AO.55.003323⟩. ⟨hal-01882073⟩

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