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Communication Dans Un Congrès Année : 2019

Series Resistance Effects on the Back-Gate Biased Operation of Junctionless Transistors (poster)

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Dates et versions

hal-02400587 , version 1 (09-12-2019)

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  • HAL Id : hal-02400587 , version 1

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Daeyoung Jeon, So Jeong Park, Mireille Mouis, Sylvain Barraud, Kim Gyu-Tae, et al.. Series Resistance Effects on the Back-Gate Biased Operation of Junctionless Transistors (poster). 2019 Joint International EuroSOI Workshop and International Conference on Ultimate Integration on Silicon (EuroSOI-ULIS), Apr 2019, Grenoble, France. Actes pp. 36-37. ⟨hal-02400587⟩
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