Identification Of Random Internal Structuring THz Tags Using Images Correlation And SIWPD Analysis
Résumé
In this work, we propose a THz tag structure based on a stack of different dielectric layers made of PE and PE-TiO2 mixture, in which we voluntary randomly deposit metallic flakes. Due to the randomness of the flake distribution (position and size), such a structure exhibits a potential unique THz signature that could be used to address identification using targeted statistical analysis. The signature is obtained by making a 2D THz image of a given area of the structure.
Domaines
Optique / photonique
Origine : Fichiers produits par l'(les) auteur(s)
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