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Identification Of Random Internal Structuring THz Tags Using Images Correlation And SIWPD Analysis

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Résumé

In this work, we propose a THz tag structure based on a stack of different dielectric layers made of PE and PE-TiO2 mixture, in which we voluntary randomly deposit metallic flakes. Due to the randomness of the flake distribution (position and size), such a structure exhibits a potential unique THz signature that could be used to address identification using targeted statistical analysis. The signature is obtained by making a 2D THz image of a given area of the structure.
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Dates et versions

hal-02297202 , version 1 (10-03-2020)

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Citer

Florent Bonnefoy, Cornel Ioana, Maxime Bernier, Nicolas Barbot, Romain Siragusa, et al.. Identification Of Random Internal Structuring THz Tags Using Images Correlation And SIWPD Analysis. IRMMW-THz 2019 - 44th International Conference on Infrared, Millimeter, and Terahertz Waves, Sep 2019, Paris, France. pp.1-1, ⟨10.1109/IRMMW-THz.2019.8873800⟩. ⟨hal-02297202⟩
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