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Communication Dans Un Congrès Année : 2016

Understanding the Interface Reaction During ALD Deposition of Thin TiO2 Films on RuO2 Layer—Impact on Physical and Electrical Properties of TiO2

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hal-01882771 , version 1 (27-09-2018)

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  • HAL Id : hal-01882771 , version 1

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A. Chaker, P. Szkutnik, J. Pointet, P. Gonon, Corentin Vallée, et al.. Understanding the Interface Reaction During ALD Deposition of Thin TiO2 Films on RuO2 Layer—Impact on Physical and Electrical Properties of TiO2. MRS Fall Meeting 2016 – symposium EM10, Nov 2016, Boston (USA), United States. ⟨hal-01882771⟩
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