Improvement of Electron Beam Lithography modeling for overdose exposures by using Dill transformation - Université Grenoble Alpes Accéder directement au contenu
Communication Dans Un Congrès Année : 2016

Improvement of Electron Beam Lithography modeling for overdose exposures by using Dill transformation

Fichier non déposé

Dates et versions

hal-01882467 , version 1 (27-09-2018)

Identifiants

Citer

Mohamed Abaidi, Mohamed Saib, Jean-Hervé Tortai, Patrick Schiavone. Improvement of Electron Beam Lithography modeling for overdose exposures by using Dill transformation. SPIE Photomask Technology, 2016, San Jose, United States. ⟨10.1117/12.2240928⟩. ⟨hal-01882467⟩
34 Consultations
0 Téléchargements

Altmetric

Partager

Gmail Facebook X LinkedIn More