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Continuous-wave scanning terahertz near-field microscope

Abstract : A versatile cw measurement setup for terahertz near-field reflectometry is proposed. Propagation, coupling, and focusing of wire guided modes are used to achieve a λ/33 resolution while imaging a metal corner deposited on glass. The setup is source and detector independent owing to wave coupling and decoupling with differential phase plates.
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https://hal.archives-ouvertes.fr/hal-00565014
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Submitted on : Wednesday, May 5, 2021 - 4:36:50 PM
Last modification on : Thursday, May 6, 2021 - 3:34:23 AM

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Jean-Paul Guillet, Laurent Chusseau, R. Adam, T. Grosjean, A. Pénarier, et al.. Continuous-wave scanning terahertz near-field microscope. Microwave and Optical Technology Letters, Wiley, 2011, 53 (3), pp.580-582. ⟨10.1002/mop.25754⟩. ⟨hal-00565014⟩

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