Probability of EMC Failure and Sensitivity Analysis With Regard to Uncertain Variables by Reliability Methods - Institut d'Electronique et de Télécommunications de Rennes
Article Dans Une Revue IEEE Transactions on Electromagnetic Compatibility Année : 2015

Probability of EMC Failure and Sensitivity Analysis With Regard to Uncertain Variables by Reliability Methods

Résumé

In this study, we use a statistical approach to treat a risk analysis of an EMC default. This approach relies upon reliability methods from probabilistic engineering mechanics. An estimation of a probability of failure (i.e., probability that the induced current by crosstalk causes a malfunction of a device connected at the end of a cable) and a sensitivity analysis of this probability of failure is carried out by taking into account uncertainties on input parameters. The reliability methods introduced in this study allow to compute a probability of failure with a relative low computational cost compared to Monte Carlo simulation.
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Dates et versions

hal-01116322 , version 1 (20-10-2018)

Identifiants

Citer

Mourad Larbi, Philippe Besnier, Bernard Pecqueux. Probability of EMC Failure and Sensitivity Analysis With Regard to Uncertain Variables by Reliability Methods. IEEE Transactions on Electromagnetic Compatibility, 2015, 57 (2), pp.274-282. ⟨10.1109/TEMC.2014.2378912⟩. ⟨hal-01116322⟩
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