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hal-00672043v1  Communication dans un congrès
D. ChaussendeVapor Phase vs. Liquid Phase: What is the Best Choice for the Growth of Bulk 3C-SiC Crystals?
European Materials Research Society (E-MRS) Spring meeting, Jun 2010, Strasbourg, France
hal-00672047v1  Communication dans un congrès
D. ChaussendeOverview of SiC bulk growth processes
Confidential, Dec 2010, Amagasaki, Japan
hal-00671980v1  Communication dans un congrès
D. ChaussendeCristallogenèse des semi-conducteurs à grand gap : contexte et enjeux
Les Midis MINATEC, Jun 2009, Grenoble, France
hal-01067399v1  Article dans une revue
T. OuisseD. ChaussendeApplication of an axial next-nearest-neighbor Ising model to the description of Mn+1AXn phases
Physical Review B : Condensed matter and materials physics, American Physical Society, 2012, 85 (10), pp.104110. <10.1103/PhysRevB.85.104110>
hal-01067393v1  Article dans une revue
F. MercierT. OuisseD. ChaussendeMorphological instabilities induced by foreign particles and Ehrlich-Schwoebel effect during the two-dimensional growth of crystalline Ti3SiC2
Physical Review B : Condensed matter and materials physics, American Physical Society, 2011, 83 (7), pp.075411. <10.1103/PhysRevB.83.075411>
hal-00173471v1  Communication dans un congrès
D. ChaussendeM. PonsR. MadarGas fed top-seeded solution growth of silicon carbide
Internatinal Conference on Silicon Carbide and Related Materials, ICSCRM2005, 2005, France. 527-529, pp.111-114, 2006
hal-00141565v1  Article dans une revue
D. ChaussendeL. Latu-RomainM. PonsHigh temperature nucleation of cubic silicon carbide on (0001) hexagonal SiC nominal surfaces
Crystal Growth and Design, American Chemical Society, 2006, 6 (12), pp.2788-2794
hal-00394391v1  Article dans une revue
L. Latu-RomainD. ChaussendeM. PonsHigh temperature nucleation of cubic silicon carbide on (0001) hexagonal-SiC nominal surfaces
Crystal Growth and Design, American Chemical Society, 2006, pp.6, 12 (2006) 2788-2794
hal-00114194v1  Article dans une revue
D. ChaussendeM. PonsP. WellmannStatus of SiC bulk growth process
Journal of Physics D: Applied Physics, IOP Publishing, 2007, 20, pp.6150-6158
hal-01116026v1  Article dans une revue
T. OuisseDidier ChaussendeLaurent AuvrayMicropipe-induced birefringence in 6H silicon carbide
Journal of Applied Crystallography, International Union of Crystallography, 2010, 43, pp.122
hal-01067400v1  Article dans une revue
T. OuisseD. ChaussendeL. AuvrayMicropipe-induced birefringence in 6H silicon carbide
Journal of Applied Crystallography, International Union of Crystallography, 2010, 43, pp.122-133. <10.1107/s0021889809043957>
hal-00426590v1  Communication dans un congrès
A. ClaudelD. ChaussendeE. BlanquetD. PiqueM. PonsInfluence of the N/Al Ratio in the Gas Phase on the Growth of AlN by High Temperature Chemical Vapor Deposition (HTCVD)
7th European Conference on Silicon Carbide and Related Materials, Sep 2008, Barcelone, Spain. Trans Tech Publications, 615-617, pp.987-990, 2009, Material Science Forum
hal-01226019v1  Article dans une revue
X. LiH. JacobsonAlexandre BoulleDidier ChaussendeA. HenryDouble-Position-Boundaries Free 3C-SiC Epitaxial Layers Grown on On-Axis 4H-SiC
ECS Journal of Solid State Science and Technology, 2014, 3 (4), pp.P75-P81. <10.1149/2.012404jss>
hal-00907667v1  Article dans une revue
Alexandre BoulleDeborah DompointI. Galben-SandulacheDidier ChaussendePolytypic transformations in SiC: Diffuse x-ray scattering and Monte Carlo simulations
Physical Review B : Condensed matter and materials physics, American Physical Society, 2013, 88, pp.024103-1-024103-10. <10.1103/PhysRevB.88.024103>
hal-00686902v1  Communication dans un congrès
Alexandre BoulleDeborah DompointI. Galben-SandulacheDidier ChaussendeDefects and polytypism in SiC : the role of diffuse X-ray scattering
G. FERRO, P. SIFFERT. E-MRS Symposium F, Jun 2010, Strasbourg, France. American Institute of Physics, 1292, pp.43-46, 2010, AIP Conference Proceedings. <10.1063/1.3518307>
hal-00686913v1  Communication dans un congrès
Deborah DompointAlexandre BoulleI.G. Galben-SandulacheDidier ChaussendeStudy of the stability of 3C-SiC single crystals using high resolution diffuse X-ray scattering
G. FERRO, P. SIFFERT. E-MRS, Jun 2010, Strasbourg, France. American Institute of Physics, 1292, pp.71-74, 2010, AIP Conference Proceedings. <10.1063/1.3518314>
hal-00758429v1  Article dans une revue
Deborah DompointAlexandre BoulleI.G. Galben-SandulacheD. ChaussendeDiffuse X-ray scattering from partially transformed 3C-SiC single crystals
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Elsevier, 2012, 284, pp.19-22. <10.1016/j.nimb.2011.09.008>
hal-00389062v1  Communication dans un congrès
D. ChaussendeJ. EidF. MercierR. MadarM. PonsNucleation and Growth of 3C-SiC Single Crystals from the Vapor Phase
7th European Conference on Silicon Carbide and Related Materials, Sep 2008, Barcelone, Spain. Trans Tech Publications, 615-617, pp.31-36, 2009, Material Science Forum
hal-01067392v1  Article dans une revue
F. MercierO. Chaix-PlucheryT. OuisseD. ChaussendeRaman scattering from Ti3SiC2 single crystals
Applied Physics Letters, American Institute of Physics, 2011, 98 (8), pp.081912. <10.1063/1.3558919>
hal-00418779v1  Article dans une revue
Alexandre BoulleJ. AubeI.G. Galben-SandulacheD. ChaussendeThe 3C-6H polytypic transition in SiC as revealed by diffuse x-ray scattering
Applied Physics Letters, American Institute of Physics, 2009, 94, 201904 (3 p.). <10.1063/1.3141509>
hal-00337375v1  Communication dans un congrès
F. MercierD. ChaussendeR. MadarM. PonsComparative study of differently grown 3C-SiC single crystals with birefringence microscopy
Internatinal Conference on Silicon Carbide and Related Materials, ICSCRM2007, 2007, Kyoto, Japan. 600-603, pp.71-74, 2009
hal-00141097v1  Communication dans un congrès
E. BlanquetD. ChaussendeS. NishizawaM. PonsHigh Temperature Silicon Carbide Chemical Vapor deposition processes: from pure thermodynamic to Mass transport modeling
European conference on Computational Dynamics, Symposium, Sep 2006, Egmondaan Zee, Netherlands. pp.1-20, 2006
hal-00374734v1  Article dans une revue
D. ChaussendeF. MercierR. MadarM. PonsComparative study of differently grown 3C-SiC single crystals with birefringence microscopy
Materials Science Forum, Trans Tech Publications Inc., 2009, 600-603, pp.71-74
hal-00196658v1  Communication dans un congrès
J.M. DedulleD. ChaussendeM. PonsR. MadarModèle de champ de phase pour la croissance cristalline
MATERIAUX 2006, 2006, France. Société de Chimie Industrielle, pp.10, 2006
hal-00196662v1  Communication dans un congrès
J.M. DedulleF. MercierD. ChaussendeM. PonsModeling of 3C-SiC Single Crystal Growth
Conférence européenne COMSOL, 2007, France. pp.8, 2007
hal-00196665v1  Communication dans un congrès
F. MercierD. ChaussendeJ.M. DedulleM. PonsPreliminary study of 3C-SiC growth from high temperature solution
Hetero'SiC'07, 2007, France. pp.2, 2007
hal-01067388v1  Article dans une revue
J. LefebureJ. M. DedulleT. OuisseD. ChaussendeModeling of the Growth Rate during Top Seeded Solution Growth of SiC Using Pure Silicon as a Solvent
Crystal Growth and Design, American Chemical Society, 2012, 12 (2), pp.909-913. <10.1021/cg201343w>