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hal-00671337v1
Communication dans un congrès
T. Bonnoit, M. Nicolaidis, N. Zergainoh. Towards a Tool for Implementing Delay-Free ECC in Embedded Memories IEEE International Conference on Computer Design (ICCD'11), Oct 2011, Amherst, Ma., United States. IEEE Computer Society, pp.441 - 442, 2011, <10.1109/ICCD.2011.6081440> |
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hal-00671366v1
Communication dans un congrès
M. Nicolaidis, T. Bonnoit, N. Zergainoh. Eliminating speed penalty in ECC protected memories Design Automation and Test in Europe Conference (DATE'11), Mar 2011, Grenoble, France. IEEE Computer Society, pp.1-6, 2011 |
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hal-01445864v1
Communication dans un congrès
T. Bonnoit, N.-E. Zergainoh, M. Nicolaidis. Robustesse des mémoires embarquées dans une architecture reconfigurable d un modulateur OFDM GDR SoC-SiP : System-on-Chip & System-in-Package, Jun 2010, Cergy, France. Academic Press, London, UK |
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hal-01137865v1
Article dans une revue
T. Bonnoit, M. Nicolaidis, N.-E. Zergainoh. Using Error Correcting Codes without Speed Penalty in Embedded Memories: Algorithm, Implementation and Case Study Journal of Electronic Testing, Springer Verlag, 2013, 29 (3), pp.383-400. <10.1007/s10836-013-5386-8> |
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hal-01523901v1
Communication dans un congrès
T. Bonnoit, A. Coelho, N.-E. Zergainoh, R. Velazco. SEU Impact in Processor's Control-Unit: Preliminary Results Obtained for LEON3 Soft-Core 18th IEEE Latin American Test Symposium (LATS’17), Mar 2017, Bogota, Colombia. ACM IEEE, pp.1-4 |
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hal-01523903v1
Communication dans un congrès
T. Bonnoit, N.-E. Zergainoh, M. Nicolaidis, R. Velazco. Low Cost Rollback to Improve Fault-Tolerance in VLSI Circuits IEEE International Symposium on Circuits and Systems (LASCAS'17), Feb 2017, Bariloche, Argentina. IEEE, pp.1-4 |
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