|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
hal-00599391v1
Communication dans un congrès
T. Frank, C. Chappaz, P. Leduc, L. Arnaud, S. Moreau et al. Resistance Increase Due to Electromigration Induced Depletion Under TSVIEEE International Reliability Physics Symposium (IRPS'11), Monterey, CA, USA, April 10-14, Apr 2011, Monterey, ca., United States. IEEE Computer Society, pp.3F.4.1 - 3F.4.6, 2011, <10.1109/IRPS.2011.5784499>
|
|
hal-00599560v1
Communication dans un congrès
T. Frank, C. Chappaz, P. Leduc, L. Arnaud, S. Moreau et al. Reliability approach of high density Through Silicon Via (TSV)12th Electronics Packaging Technology Conference (EPTC'10), Dec 2010, Singapore, Singapore. IEEE Computer Society, pp.321 - 324, 2010, <10.1109/EPTC.2010.5702655>
|
|
|
|
|
|
|
|
|
|
|
|
hal-01281368v1
Autre publication
Axel, Nothnagel, Walter, Alef, Jun, Amagai, Per Helge, Andersen, Tatiana, Andreeva et al. The IVS data input to ITRF20142015ivs.data..1N - GFZ Data Services, Helmoltz Centre, Potsdam, Germany. 2015, <10.5880/GFZ.1.1.2015.002>
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
hal-01356638v1
Article dans une revue
Fahd Benjelloun, Zéliha Oruc, Nicole Thielens, Bernard Verrier, Gael Champier et al. First Membrane Proximal External Region-Specific Anti-HIV1 Broadly Neutralizing Monoclonal IgA1 Presenting Short CDRH3 and Low Somatic Mutations.Journal of Immunology, Publisher : Baltimore : Williams & Wilkins, c1950-. Latest Publisher : Bethesda, MD : American Association of Immunologists, 2016, 197 (5), pp.1979-88. <10.4049/jimmunol.1600309>
|
|
|
|
|
|
|
|
|
|
|
|
|