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hal-00156318v1
Communication dans un congrès
V. Pouget, A. Douin, D. Lewis, P. Fouillat, G. Foucard et al. Tools and methodology development for pulsed laser fault injection in SRAM-based FPGAs 8th Latin-American Test Workshop (LATW'07), 2007, Cuzco, Peru. IEEE Computer Society, pp.Session 8, 2007 |
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hal-00156489v1
Communication dans un congrès
A. Ferrer, R. Velazco, R. Ecoffet, F. Bezerra. Error rate issued from a multiple upset injection method with realistic time distribution: A case study 8th Latin-American Test Workshop (LATW'07), Mar 2007, Cuzco, Peru. IEEE Computer Society, pp.session 9, 2007 |
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hal-00156550v1
Communication dans un congrès
J.M. Fernandes, M.B. Santos, A.L. Oliveira, J.P. Teixeira, R. Velazco. Sensitivity to SEUs evaluation using probabilistic testability analysis at RTL 8th Latin-American Test Workshop (LATW'07), Mar 2007, Cuzco, Peru. IEEE Computer Society, pp.session 9, 2007 |
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hal-00156568v1
Communication dans un congrès
J.M. Espinosa-Duran, J. Velasco-Medina, G. Huertas, R. Velazco, J.L. Huertas. Single event transient injection on an operational amplifier: a case study 8th Latin-American Test Workshop (LATW'07), Mar 2007, Cuzco, Peru. IEEE Computer Society, pp.session 8, 2007 |
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hal-00156596v1
Communication dans un congrès
P. Ferreyra, G. Viganotti, C.A. Marques, R. Velazco, R. Ferreyra. Failure and coverage factors based Markoff models: a new approach for improving the dependability estimation in complex fault tolerant systems exposed to SEUs Radiation and its Effects on Components and Systems (RADECS' 06), Sep 2006, Athens, Greece. IEEE Computer Society, pp.PA-9, 2006 |
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in2p3-01038056v1
Poster
F. Villa, M. Baylac, S. Rey, O. Rossetto, W. Mansour et al. Accelerator-based neutron irradiation of integrated circuits at GENEPI2 (France) Nuclear and Space Radiation Effects Conference (NSREC2014), Jul 2014, Paris, France. IEEE, 2014 IEEE Radiation Effects Data Workshop 14-18 July 2014, Paris, France, Workshop Record, pp.1-5, 2014, <10.1109/REDW.2014.7004511> |
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in2p3-01038067v1
Poster
R. Velazco, J. A. Clemente, G. Hubert, W. Mansour, C. Palomar et al. Evidence of the Robustness of a COTS Soft-Error Free SRAM to Neutron Radiation Nuclear and Space Radiation Effects Conference (NSREC2014), Jul 2014, Paris, France. IEEE Transactions on Nuclear Science, 61 (6), pp.3103 - 3108, 2014, <10.1109/TNS.2014.2363899> |
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hal-00975378v1
Communication dans un congrès
R. Velazco. Radiation Effects on integrated circuits: origines, test methodologies and real life experiments XV Reunión de Trabajo en Procesamiento de la Información y Control, Sep 2013, San Carlos de Bariloche, Argentina |
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hal-00975371v1
Communication dans un congrès
R. Velazco. Single Event Effects on Digital Integrated Circuits: Origins and Mitigation Techniques Workshop Education Society and Computational Iintelligence Society (WESCIS'2013), Sep 2013, Tucuman, Argentina |
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hal-01374476v1
Communication dans un congrès
J.P. David, J.G. Loquet, P. Cheynet, R. Velazco, R. Ecoffet et al. Comparison between ground tests and flight data for two static 32 KB memories The 5th European Conference on Radiation and its effects on components and systems (RADECS'99), Sep 1999, Abbaye de Fontevraud, France. Proceedings |
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hal-01374480v1
Communication dans un congrès
P. Cheynet, R. Velazco, R. Ecoffet, S. Duzellier, J.P. David et al. One year SEU flight results for two 32KB commercial SRAMs on-board a scientific satellite The 5th IEEE International On-Line Testing Workshop (IOLTW'99), Jul 1999, Rhodes, Greece. IEEE, pp.108-111, Proceedings |
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hal-01375438v1
Communication dans un congrès
R. Velazco, P. Ferreyra, A. Corominas Murtra. Injecting bit flip faults by means of a purely software approach : a case studied IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'02), Nov 2002, Vancouver, BC, Canada. IEEE |
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hal-01375434v1
Communication dans un congrès
B. Nicolescu, R. Velazco. Efficiency of a software approach for transient error detection: a case study 4th IEEE Latin-American Test Workshop (LATW'03), Feb 2003, Natal, Brésil. IEEE, Proceedings |
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hal-01375417v1
Communication dans un congrès
A. Corominas Murtra, B. Nicolescu, R. Velazco. An automated technique to provide software applications with SEU detection capabilities: basic principles and preliminary results Radiation and its effects on Components and Systems Workshop (RADECS'02), Sep 2002, Padova, Italie. IEEE |
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hal-01375421v1
Communication dans un congrès
A. Corominas Murtra, R. Velazco, R. Ecoffet. Predicting error rates provoked by radiation in digital architectures: methods and tools 5th Workshop on Radiation Effects on Semiconductor Devices for Space Application (RESEDA'02), Oct 2002, Takasaki, Japon. Proceedings |
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hal-00673067v1
Communication dans un congrès
J.R. Azambuja, S. Pagliarini, M. Altieri, F. Lima Kastensmidt, M. Hübner et al. Non-Intrusive Reconfigurable HW/SW Fault Tolerance Approach to Detect Transient Faults in Microprocessor Systems 12th European Conference on Radiation and its Effects on Components and Systems (RADECS'11), Sep 2011, Sevilla, Spain. 2011 |
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hal-00673077v1
Communication dans un congrès
E. Sanchez, P. Ferreyra, C.A. Marques, R. Velazco. Performance de Computadoras SIMD Implementadas en FPGAs XVII IBERCHIP workshop, Feb 2011, Bogota, Colombia. 2011 |
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hal-01123589v1
Communication dans un congrès
A. Souari, Cl. Thibeault, Y. Blaquière, R. Velazco. Towards a realistic SEU effects emulation on SRAM Based FPGAs Nuclear and Space Radiation Effects Conference (NSREC'14), Jul 2014, Paris, France. IEEE Computer Society, 2014, Proceedings of IEEE Nuclear and Space Radiation Effects Conference (NSREC'14) |
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hal-00374751v1
Communication dans un congrès
C.A. Lisboa, P. Peronnard, E. Rhod, R. Velazco, L. Carro. Validation by Fault Injection of a Hardening Technique for Matrix Multiplication Algorithms European Workshop on Radiation Effects on Components and Systems (RADECS'08), Sep 2008, Jyväskylä, Finland. pp.321-324, 2008 |
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hal-00374744v1
Communication dans un congrès
P. Peronnard, R. Velazco, G. Foucard, V. Pouget, G. Berger et al. Remote SEE Testing Capabilities with Heavy Ions and Laser Beams at CYCLONE-HIF and ATLAS Facilities Radiation Effects Data Workshop, Jul 2008, Tucson, AZ, United States. IEEE Computer Society, pp.106-109, 2008, <10.1109/REDW.2008.26> |
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hal-00672465v1
Article dans une revue
H. Ziade, R. Ayoubi, R. Velazco. A new fault injection approach to study the impact of bitflips in the configuration of SRAM-based FPGAs International Arab Journal of Information Technology (IAJIT), 2011, 8 (2), pp.155-162 |
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hal-00672442v1
Article dans une revue
W. Mansour, R. Ayoubi, H. Ziade, R. Velazco, W. El Falou. An Optimal Implementation on FPGA of a Hopfield Neural Network Advances in Artificial Neural Systems, 2011, pp.Article ID 189368. <10.1155/2011/189368> |
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hal-01376266v1
Communication dans un congrès
V. Pouget, P. Fouillat, R. Velazco, D. Lewis, D. Dallet. Performance impact of various SEE mechanisms in classical analog-to-digital converter architectures IEEE Nuclear and Space Radiation Effects Conference (NSREC'03), Jul 2003, Monterey, CA, United States. IEEE |
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hal-00674535v1
Communication dans un congrès
R. Velazco. Effects of Radiation on Integrated Circuits : origines, mitigation techniques, test and real-life experiments Conférence magistrale in Congreso de Informática Univ. Tecnológica de Machala (III CIU/), Jun 2011, Machala, Ecuador. 2011 |
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hal-00747172v1
Communication dans un congrès
G. Hubert, R. Velazco, C.A. Federico, A. Cheminet, C. Silva Cardenas et al. Continuous high-altitude measurements of cosmic ray neutrons and SEU/MCU at various locations: correlation and analyses based on MUSCA SEP3 Radiation Effects on Components and Systems (RADECS'12), Sep 2012, Biarritz, France. pp.PA-2, 2012 |
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hal-00747354v1
Communication dans un congrès
W. Mansour, R. Velazco. An automated SEU fault-injection method and tool for HDLbased designs Radiation Effects on Components and Systems (RADECS'12), Sep 2012, Biarritz, France. pp.PH-6, 2012 |
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hal-00747152v1
Communication dans un congrès
A. Cheminet, G. Hubert, V. Lacoste, R. Velazco, D. Boscher. Characterization of the neutron environment at the CERN-EU High Energy Reference Field and at the Pic du Midi Radiation Effects on Components and Systems (RADECS'12), Sep 2012, Biarritz, France. 2012 |
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hal-00005828v1
Communication dans un congrès
L. Anghel, R. Velazco, E. Sanchez, M. Sonza Reorda, G. Squillero. Coupling Different Methodologies to Validate Obsolete Microprocessors 19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'04), 2004, Cannes, France. IEEE Computer Society, pp.250-255, 2004, <10.1109/DFT.2004.21> |
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hal-00005829v1
Communication dans un congrès
L. Anghel, R. Velazco, S. Saleh, S. Deswaertes, A. El Moucary. Preliminary Validation of an Approach Dealing with Processor Obsolescence 18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'03), 2003, Boston, Cambridge, Ma, United States. IEEE Computer Society, pp.493, 2003, <10.1109/DFTVS.2003.1250148> |
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hal-00005832v1
Communication dans un congrès
R. Velazco, L. Anghel, S. Saleh. A Methodology for Test Replacement Solutions of Obsolete Processors 9th IEEE International On-Line Testing Symposium, 2003, Kos International Convention Center, Kos Island, Greece. IEEE Computer Society, pp.209, 2003, <10.1109/OLT.2003.1214400> |
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