Detection of the first charged states in ultrasmall Si single-hole transistor using dual-channel radio frequency reflectometry

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http://hal.univ-grenoble-alpes.fr/hal-02018063
Contributor : Marc Sanquer <>
Submitted on : Wednesday, February 13, 2019 - 3:34:47 PM
Last modification on : Tuesday, November 5, 2019 - 1:58:39 PM

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Alexei Orlov, Patrick Fay, Gregory Snider, Xavier Jehl, Sylvain Barraud, et al.. Detection of the first charged states in ultrasmall Si single-hole transistor using dual-channel radio frequency reflectometry. 2014 72nd Annual Device Research Conference (DRC), Jun 2014, Santa Barbara, France. pp.83-84. ⟨hal-02018063⟩

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