Electrical diagnostics of high voltage devices via high resolution near field analysis

Gwenaël Gaborit 1, 2 Laurane Gillette 2 Guillaume Revillod 2 Jean Dahdah 3 Lionel Duvillaret Christophe Volat Christian Pons Emmanuel Bic Laura Giannini Erwan Dumont
1 IMEP-LAHC - Institut de Microélectronique, Electromagnétisme et Photonique - Laboratoire d'Hyperfréquences et Caractérisation
2 Kapteos SAS
3 FEMTO-ST - Franche-Comté Électronique Mécanique, Thermique et Optique - Sciences et Technologies (UMR 6174)
Document type :
Conference papers
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http://hal.univ-grenoble-alpes.fr/hal-02018044
Contributor : Gwenael Gaborit <>
Submitted on : Wednesday, February 13, 2019 - 3:24:25 PM
Last modification on : Thursday, March 7, 2019 - 12:51:08 PM

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  • HAL Id : hal-02018044, version 1

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CNRS | UNIV-BM | UNIV-FCOMTE | UNIV-BM-THESE | FEMTO-ST | UNIV-SAVOIE | PHOTO | IMEP-LAHC | UGA

Citation

Gwenaël Gaborit, Laurane Gillette, Guillaume Revillod, Jean Dahdah, Lionel Duvillaret, et al.. Electrical diagnostics of high voltage devices via high resolution near field analysis. 2016 IEEE Electrical Insulation Conference (EIC), Jun 2016, Montreal, Canada. pp.555-558. ⟨hal-02018044⟩

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