Level Spectrum and Charge Relaxation in a Silicon Double Quantum Dot Probed by Dual-Gate Reflectometry

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http://hal.univ-grenoble-alpes.fr/hal-02005819
Contributor : Marc Sanquer <>
Submitted on : Monday, February 4, 2019 - 11:39:20 AM
Last modification on : Tuesday, November 5, 2019 - 1:58:39 PM

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Alessandro Crippa, Romain Maurand, Dharmraj Kotekar-Patil, Andrea Corna, Heorhii Bohuslavskyi, et al.. Level Spectrum and Charge Relaxation in a Silicon Double Quantum Dot Probed by Dual-Gate Reflectometry. Nano Letters, American Chemical Society, 2017, 17 (2), pp.1001-1006. ⟨hal-02005819⟩

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