Communication Dans Un Congrès Année : 2009

Behaviour of CPW and TFMS lines at high temperature for RF applications in sub-45 nm nodes

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hal-00602823 , version 1 (23-06-2011)

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  • HAL Id : hal-00602823 , version 1

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C. Roda Neve, A. Farcy, M. Gallitre, B. Blampey, P. Meuris, et al.. Behaviour of CPW and TFMS lines at high temperature for RF applications in sub-45 nm nodes. Behaviour of CPW and TFMS lines at high temperature for RF applications in sub-45 nm nodes, Mar 2009, Grenoble, France. ⟨hal-00602823⟩
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