Loading...
Recherche
Derniers dépôts
![Chargement de la page](/img/loading.gif)
Dépôts en texte intégral
93
Mots clés
Silicon Carbide
Transparent conductive oxide TCO
ALD
Thin films
Nanostructures
XRD
Measurement
Atomic Layer Deposition ALD
Silicon carbide
Ion implantation
27Alda
17O
Interface defects
Epitaxy
Energy loss
Auger electron spectroscopy AES
17Op
X-ray diffraction
Density functional theory
Pb centers
Raman spectroscopy
AFM
Pulsed laser deposition
Photoluminescence
Nickel
Nitridation
Alloys
Topological defects
17Opp
Silicon
Epitaxial growth
Gold
Adsorption
Isotopic Tracing
Periodic multilayer
Ion beam analysis
Topological insulators
PIXE
Adsorption Isotherms
6855Jk
Rutherford backscattering spectrometry RBS
Oxidation
Zinc oxide
XPS
2H
HfO2
Annealing
Sputtering
Gallium oxide
Stable isotopic tracing
ADSORPTION DESORPTION HYSTERESIS
Nanoparticles
Acoustic
Kossel diffraction
Adsorbed layers
13C
18O resonance
Growth
NRP
Oxygen deficiency
Capillary condensation
7550Ee
15N
Thin film
Metal-insulator transition
Magnetization curves
Ferromagnetic resonance
Evaluation
Passivation
Hysteresis
8140Ef
Aluminium
Indium oxide
Multilayer
Diffusion
18O
EPR
Channeling
7550Pp
Alloy
Nuclear resonance profiling NRP
Acoustic propreties of solid
3C-SiC
Nuclear reaction analysis
AC susceptibility
RBS
Ageing
Al2O3
Silica
27Aldp
SiC
Magnetic anisotropy
Defects
Aluminum
Charge exchange
GaMnAs
Low energy electron diffraction LEED
7630Lh
Magnetic semiconductors
27Ald p&α